Measurements of Mn valence in BaTiO<sub>3</sub> by using secondary ion mass spectrometry

DOI

Bibliographic Information

Other Title
  • ２次イオン質量分析によるBaTiO<sub>3</sub>中の添加Mnの価数計測

Abstract

<p>Determination of Mn valence in oxide-substances is quite difficult by conventional methods, i.e. X-ray photoelectron spectroscopy (XPS), X-ray fluorescence (XRF) analysis, etc. Even more difficult that should be for slightly Mn-doped system. We propose that secondary ion mass spectrometry (SIMS) is suitable for determining valence of dilute Mn ion in oxides. In this report, we show an approach to determine Mn valence in BaTiO3:Mn (less than 1 at.%) from a mass spectrum pattern which consists of several MnOx signals, compared with those of the standard samples, LaMn3+O3 and SrMn4+O3.</p>

Journal

Details 詳細情報について

  • CRID
    1390009018099275776
  • NII Article ID
    130008134217
  • DOI
    10.14886/jvss.2021.0_3p11
  • ISSN
    24348589
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Disallowed

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