Heavy ion monitor as an application of oxide semiconductors
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- Miyoshi Hiroaki
- Osaka Univ. SHARP Corp. Univ Tokyo
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- Koyama Akihiro
- Univ Tokyo
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- Otaka Yutaka
- Univ Tokyo
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- Shimazoe Kenji
- Univ Tokyo
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- Hirumi Genki
- Chiba Univ. NIRS
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- Nitta Munetaka
- Chiba Univ. NIRS
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- Nisikido Fumihiko
- NIRS
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- Yamaya Taiga
- NIRS
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- Onoye Takao
- Osaka Univ.
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- Takahashi Hiroyuki
- Univ Tokyo
Bibliographic Information
- Other Title
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- 酸化物半導体応用による重粒子検出器
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2018.1 (0), 663-663, 2018-03-05
The Japan Society of Applied Physics
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Keywords
Details 詳細情報について
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- CRID
- 1390012180533169536
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC