Characterization of ZnO/Si Junctions using Polarity-Controlled ZnO Thin Films
-
- Ohsawa Takeo
- NIMS
-
- Yamagata Yoshihito
- Hosei Univ.
-
- Ishigaki Takamasa
- Hosei Univ.
-
- Ohashi Naoki
- NIMS
Bibliographic Information
- Other Title
-
- 極性制御したZnO薄膜を用いたZnO/Si 接合の特性評価
Journal
-
- JSAP Annual Meetings Extended Abstracts
-
JSAP Annual Meetings Extended Abstracts 2017.2 (0), 3886-3886, 2017-08-25
The Japan Society of Applied Physics
- Tweet
Keywords
Details 詳細情報について
-
- CRID
- 1390012468134111616
-
- ISSN
- 24367613
-
- Text Lang
- ja
-
- Data Source
-
- JaLC