Effects of Film Thickness and Annealing on Thermoelectric Properties of <i>a</i>-IGZO
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- Tawa Yuki
- NAIST
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- Uenuma Mutsunori
- NAIST
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- Fujimoto Yuta
- NAIST
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- Okamoto Naofumi
- NAIST
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- Ishikawa Yasuaki
- NAIST
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- Yamashita Ichiro
- NAIST
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- Uraoka Yukiharu
- NAIST
Bibliographic Information
- Other Title
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- <i>a</i>-InGaZnO薄膜の熱電特性における膜厚とアニールの影響
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2016.2 (0), 1872-1872, 2016-09-01
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390013706727635968
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC