Dynamic Structure Analysis of Soft Interfaces Using Synchrotron X-ray Source
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- YANO Yohko F.
- Department of Physics, Kindai University
Bibliographic Information
- Other Title
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- 放射光を使ったソフト界面の動的構造解析
Abstract
<p>Soft molecular thin films formed at liquid interfaces are useful research targets as model systems for elucidating the functions of emulsions and biological membranes. Grazing incidence X-ray reflection/diffraction measurement is one of the powerful experimental techniques for the structural study of soft interfaces. Synchrotron radiation, which is orders of magnitude stronger than X-rays in the laboratory, allows measurements to be made in a short time, enabling us to track structures that change over time. In this paper, we describe the dynamic structure measurement technique using synchrotron radiation and the mechanism of protein adsorption at the interface revealed by this method.</p>
Journal
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- Oleoscience
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Oleoscience 23 (3), 121-126, 2023
Japan Oil Chemists' Society
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Details 詳細情報について
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- CRID
- 1390013873419238912
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- ISSN
- 21873461
- 13458949
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- Text Lang
- ja
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- Data Source
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- JaLC
- Crossref
- KAKEN
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- Abstract License Flag
- Disallowed