Measurements of Proton Irradiation Effects in Light Emitting Devices

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  • 発光デバイスのプロトン照射効果測定
  • ハッコウ デバイス ノ プロトン ショウシャ コウカ ソクテイ

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Abstract

A measurement system for proton radiation effects in light emitting devices such as light emitting diodes and semiconductor lasers are described. 10-MeV and 200-MeV proton beams in the Wakasawan Energy Research Center are utilized. Current vs. voltage characteristics, current vs. light output characteristics and spectra can be measured using an integration sphere, a Si photodiode, a data logger and a spectrometer. In the case of 200-MeV irradiation, remote measurement is conducted.

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