Digital surface models of the surface ruptures obtained by affordable mobile 3D scanners with built-in SLAM technology

DOI
  • Iwasa Yoshiya
    JSPS Research Fellow Graduate School of Humanities and Social Sciences, Hiroshima University
  • Hama Akira
    Graduate School of Horticulture, Chiba University
  • Nakata Takashi
    Hiroshima University
  • Kumahara Yasuhiro
    Graduate School of Humanities and Social Sciences, Hiroshima University
  • Goto Hideaki
    Graduate School of Humanities and Social Sciences, Hiroshima University
  • Yamanaka Tomoru
    JSPS Research Fellow Graduate School of Humanities and Social Sciences, Hiroshima University

Bibliographic Information

Other Title
  • SLAM技術を用いた低価格モバイル3Dスキャナーによる地表地震断層の数値表層モデルの作成とその有効性

Abstract

<p>  In order to evaluate the applicability of 3D scanners for field survey on surface ruptures, we examined the scanning accuracy, point cloud density, usability, and time efficiency of the instruments of three different SLAM methods, Avia for LiDAR SLAM, ZED 2 for Visual SLAM, and iPad Pro for Depth SLAM</p><p>  We conducted experimental surveys on the surface ruptures associated with the 2016 Kumamoto Earthquake at two locations. One is the surface rupture preserved as the earthquake heritage in the Aso field of Tokai University, while another is a normal fault rupture in the forested area at Miyayama, Nishihara Village, Kumamoto Prefecture. All the scanners obtained detailed point clouds, from which we successfully made digital surface models, cross-profiles and contour maps in a few tens of minutes. We came to know that Avia is most effective among the three scanners for wide-area mapping and that iPad Pro is a useful handy instrument for mapping limited areas. From our experimental survey, it is highly recommended to use Avia and iPad Pro together (in the field) in order to collect detailed geometric data of surface ruptures immediately after earthquake.</p>

Journal

  • Active Fault Research

    Active Fault Research 2022 (57), 1-13, 2022-12-26

    Japanese Society for Active Fault Studies

Details 詳細情報について

  • CRID
    1390015100310754688
  • DOI
    10.11462/afr.2022.57_1
  • ISSN
    21865337
    09181024
  • Text Lang
    ja
  • Data Source
    • JaLC
  • Abstract License Flag
    Disallowed

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