How to Use Reference Materials in Reference-Free X-Ray Fluorescence Analysis
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- SAKURAI Kenji
- National Institute for Materials Science
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- MIZUHIRA Manabu
- Bruker Japan
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- AOYAMA Tomoki
- HORIBA Ltd.
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- MATSUNAGA Daisuke
- HORIBA Ltd.
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- YAMADA Yasujiro
- Rigaku Corp.
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- IKEDA Satoshi
- Rigaku Corp.
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- OMORI Takashi
- Techno X Co., Ltd.
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- NISHINO Makoto
- Shimadzu Corporation
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- NAKAMURA Hideki
- Shimadzu Corporation
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- OKI Mitsuhiro
- Toshiba Corporation
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- FUKAI Takayuki
- Hitachi High-Tech Science Corporation
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- OHGAKI Masataka
- Hitachi High-Tech Science Corporation
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- KINUGASA Genki
- JEOL
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- ONUMA Masayuki
- Toshiba Nanoanalysis Corporation
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- NOMA Takashi
- Canon Inc.
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- YAMAJI Isao
- Spectris Co., Ltd PANalytical Division
Bibliographic Information
- Other Title
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- リファレンスフリー蛍光X線分析における標準物質の使用について
- —Experience in the Certified Reference Material NMIJ CRM 5208-a—
- ―金属多層膜の認証標準物質 NMIJ CRM 5208-aでの経験を中心に―
Description
<p>In the latest practical X-ray fluorescence analysis, reference-free determination without the use of calibration curve is frequently employed. Supplying and distributing certified reference materials widely are crucial to maintain high reliability of analysis, in spite of wide variety of instruments, operators and conditions for measurements. Based on some experiences of the round robin test for developing the certified reference material NMIJ CRM 5208-a, the present paper describes some recommendations and remarks for end users.</p>
Journal
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- Advances in X-Ray Chemical Analysis, Japan
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Advances in X-Ray Chemical Analysis, Japan 49 (0), 77-82, 2018-03-31
The Discussion Group of X-Ray Analysis, The Japan Society for Analytical Chemistry
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Details 詳細情報について
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- CRID
- 1390015443655050752
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- ISSN
- 27583651
- 09117806
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- Text Lang
- ja
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- Data Source
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- JaLC
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- Abstract License Flag
- Allowed
