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Development of Soft X-Ray Quick XAFS System at Ritsumeikan University SR Center
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- YOSHIMURA Masashi
- The SR Center, Ritsumeikan University
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- NAKANISHI Koji
- The SR Center, Ritsumeikan University
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- MITSUHARA Kei
- Department of Physics, College of Science and Technology, Ritsumeikan University
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- KIKUZAKI Shota
- Department of Applied Chemistry, College of Life Sciences, Ritsumeikan University
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- KOJIMA Kazuo
- Department of Applied Chemistry, College of Life Sciences, Ritsumeikan University
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- ORIKASA Yuki
- Department of Applied Chemistry, College of Life Sciences, Ritsumeikan University
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- OHTA Toshiaki
- The SR Center, Ritsumeikan University
Bibliographic Information
- Other Title
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- 立命館大学SRセンター軟X線XAFSビームラインへのQuick XAFSシステムの導入
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Description
<p>The soft X-ray absorption fine structure (XAFS) is a powerful tool to analyze light elements in materials. The quick-scan XAFS (QXAFS) is a popular technique for time-resolved measurement using hard X-ray. We introduced a QXAFS system to the soft X-ray XAFS beamline (BL-13) at the SR Center, Ritsumeikan University. Si K-edge QXAFS measurement during charging process of a Li-ion battery was carried out. The soft X-ray QXAFS measurement enables to shorten the measurement time.</p>
Journal
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- Advances in X-Ray Chemical Analysis, Japan
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Advances in X-Ray Chemical Analysis, Japan 48 (0), 386-393, 2017-03-31
The Discussion Group of X-Ray Analysis, The Japan Society for Analytical Chemistry
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Keywords
Details 詳細情報について
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- CRID
- 1390015675348023552
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- ISSN
- 27583651
- 09117806
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- Text Lang
- ja
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- Data Source
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- JaLC
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- Abstract License Flag
- Allowed
