Test Techniques for 3D-ICs

Details 詳細情報について

• CRID

  1390016504861602816

• NII Book ID

  AA11231565

• DOI

  10.5104/jiep.26.669

• ISSN

  1884121X

  13439677

• Web Site

  https://tokushima-u.repo.nii.ac.jp/records/2012791

  https://www.jstage.jst.go.jp/article/jiep/26/7/26_669/_pdf

• Text Lang

  ja

• Article Type

  journal article

• Data Source

  • JaLC
  • IRDB
  • Crossref
  • OpenAIRE