X-Ray Fluorescence Analysis for Small Quantities of Organic Samples Using Theoretical Intensity of Scattered X-Rays
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- OGAWA Rie
- Shimadzu Corporation
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- OCHI Hirotomo
- Shimadzu Corporation
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- NISHINO Makoto
- Shimadzu Corporation
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- ICHIMARU Naoto
- Shimadzu Analytical & Measuring Center, Inc.
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- YAMATO Ryosuke
- Shimadzu Analytical & Measuring Center, Inc.
Bibliographic Information
- Other Title
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- 散乱X線の理論強度を用いる少量有機試料の蛍光X線分析
Abstract
<p>Quantitative analysis of small quantities of organic samples was performed by X-ray fluorescence analysis using the fundamental parameter method. Intensity ratio calculations with respect to fluorescent X-rays using continuous scattered X-rays and quantification of the hydrocarbon (principal component of the samples) using Rh Kα Compton scattered X-rays were investigated for shape correction. The results indicated that continuous scattered X-rays are suitable for low-concentration samples, such as foods, and Rh Kα Compton scattered X-rays are suitable for high-concentration samples, such as polyvinyl chloride resin. It was also shown that which method to use can be determined using a threshold value for the measured intensity ratios calculated using Rh Kα Compton scattered X-rays and Rh Kα Rayleigh scattered X-rays.</p><p>Further investigations indicated that the intensity ratio of the Rh Kα Compton scattered X-rays and Rh Kα Rayleigh scattered X-rays can be used for shape correction, as well as to differentiate between the methods described above. This method may result in some discrepancies in the quantitation values, but is expected to be effective for the analysis of small quantities of both high-concentration and low-concentration organic samples.</p>
Journal
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- Advances in X-Ray Chemical Analysis, Japan
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Advances in X-Ray Chemical Analysis, Japan 42 (0), 315-324, 2011-03-31
The Discussion Group of X-Ray Analysis, The Japan Society for Analytical Chemistry
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Keywords
Details 詳細情報について
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- CRID
- 1390016814364723328
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- ISSN
- 27583651
- 09117806
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- Text Lang
- ja
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- Data Source
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- JaLC
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- Abstract License Flag
- Allowed