44　赤外線カメラによる太陽電池モジュールのバイパス回路の開放故障検出技術

DOI

書誌事項

タイトル別名
  • 44　Open Fault Detection of Bypass Circuit of PV Module with IR Camera
  • ―Effect of Applied Voltage Amplitude In The Case of Two Faults―
  • ―2箇所開放故障時に印加電圧の大きさが与える影響―

抄録

<p>With conventional technology, even if it is possible to discover whether there is an open fault bypass circuit in a string, it is difficult to pinpoint its location. When a voltage is applied in the direction in which the bypass circuit of the PV module operates, the temperature rises in the open fault PV cluster, and this is used to identify the fault position. The purpose of this study is to identify the location of open fault PV cluster. In this paper, we describe the effect of amplitude of the applied voltage across a string to identify the two open fault cluster in a string.</p>

収録刊行物

キーワード

詳細情報 詳細情報について

  • CRID
    1390017688031638528
  • DOI
    10.24632/jsesc.2023.0_155
  • ISSN
    2758478X
  • 本文言語コード
    ja
  • データソース種別
    • JaLC
  • 抄録ライセンスフラグ
    使用可

問題の指摘

ページトップへ