書誌事項
- タイトル別名
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- Frontiers of Near Ambient Pressure X-ray Photoelectron Spectroscopy
抄録
<p>X-ray Photoelectron Spectroscopy (XPS) is widely used as one of the primary techniques for investigating the surface chemical composition of materials. In recent years, there has been a significant increase in the demand to observe the electronic states associated with chemical reactions under operating conditions close to real environments, such as in fuel cells and catalytic materials. To address this need, Near Ambient Pressure X-ray Photoelectron Spectroscopy (NAP-XPS) instruments have been developed and continuously improved. This article introduces atmospheric pressure photoelectron spectroscopy at pressures of several bars and provides data examples. Additionally, we present software technology designed to visualize spatiotemporal-resolved data expected to be obtained in the future using this measurement technique.</p>
収録刊行物
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- 表面と真空
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表面と真空 67 (3), 112-116, 2024-03-10
公益社団法人 日本表面真空学会
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詳細情報 詳細情報について
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- CRID
- 1390017965043351680
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- ISSN
- 24335843
- 24335835
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
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- 抄録ライセンスフラグ
- 使用不可