Substrates for enhancing contrast in optical microscope images of layered materials

DOI

Bibliographic Information

Other Title
  • 層状物質の光学顕微鏡像におけるコントラストを増強するための基板

Abstract

<p>Optical observation of ultrathin films on substrates is important in layered materials research. Ultrathin films have been visualized using the optical interference effect of thermally-grown silicon substrates. We propose a visualization technique that focuses on the optical properties of the substrate. The method allows recognition of monolayer and reliable identification of the number of layers of hexagonal boron nitride films. Furthermore, the monolayer thickness difference in a thick film is visualized, which can be applied to the selection of mechanically exfoliated films. </p>

Journal

  • Oyo Buturi

    Oyo Buturi 93 (4), 231-235, 2024-04-01

    The Japan Society of Applied Physics

Details 詳細情報について

  • CRID
    1390018198841974400
  • DOI
    10.11470/oubutsu.93.4_231
  • ISSN
    21882290
    03698009
  • Text Lang
    ja
  • Data Source
    • JaLC
  • Abstract License Flag
    Disallowed

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