Chemical State Analysis of Tantalum and Tungsten Compounds Based on L Emission
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- UEHARA Yasushi
- Advanced Technology R&D Center, Mitsubishi Electric Co.
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- KAWASE Kazumasa
- Advanced Technology R&D Center, Mitsubishi Electric Co.
Bibliographic Information
- Other Title
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- L特性X線を用いたタンタルおよびタングステン化合物の状態分析法の検討
Description
<p>L-series absorptions and emissions of tantalum and tungsten compounds were studied using brilliant synchrotron radiation excitation. We showed that L1 XANES are more sensitive to the chemical state of samples than L3 XANES. We also revealed in the L emissions exited just above the L1 threshold that the Compton scattering from Ta2O5 is extremely week compared with other compounds, and there are clear difference in the intensity of Lγ emissions among tungsten compounds.</p>
Journal
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- Advances in X-Ray Chemical Analysis, Japan
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Advances in X-Ray Chemical Analysis, Japan 38 (0), 99-108, 2007-03-31
The Discussion Group of X-Ray Analysis, The Japan Society for Analytical Chemistry
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Keywords
Details 詳細情報について
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- CRID
- 1390020784676106624
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- ISSN
- 27583651
- 09117806
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- Text Lang
- ja
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- Data Source
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- JaLC
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- Abstract License Flag
- Allowed