散乱線強度比を用いた蛍光Ｘ線分析による大気粉じん中の軽元素の補正定量法

DOI NDLデジタルコレクション Web Site Web Site 被引用文献1件

書誌事項

タイトル別名
  • A correction method for the determination of low atomic number elements in aerosols by XRF analysis by using an intensity ratio between Compton and Thomson scattering.
  • サンランセン キョウドヒ オ モチイタ ケイコウ Xセン ブンセキ ニ ヨル

この論文をさがす

抄録

Attempts were made to determine low atomic number elements such as Al and Si in aerosols by XRF analysis. A simple method for correcting X-ray absorption effect for low atomic number element determination was investigated by using an intensity ratio between Compton and Thomson scattering. A linear relationship was found between mean atomic number (Z) of a sample and the scattering X-ray ratio (ICom/IThom), as follows.<BR>ICom/IThom=-0.366Z+5.27(r=0.988)<BR>The mean atomic munber (Z) of the aerosol sample was determined by measuring the scattering X-ray ratio (ICom/IThom). The mass attenuation coefficient (X) for the sample was then calculated from the mean atomic number (Z) and the measured wavelength (λ), as<BR>X=C λ2.92Z3.07<BR>Finally, the correction coefficient (t), which corrects the X-ray absorption effect, was calculated from the mass attenuation coefficient (X) and the aerosol mass weight (M), as<BR>t=1-exp(-XMcosec 40)/XMcosec 40<BR>Therefore, it is possible to correct the X-ray absorption effect by only measuring the scattering X-ray ratio. In order to evaluate this correction method, the same aerosol samples were analyzed by alkali fusion/ICP-AES. The corrected values of Al, Si and Ca obtained by XRF analysis agreed well with those by ICP-AES. Therefore, this correction method for the XRF analysis can be applied to the determination of low atomic number elements such as Al and Si in aerosols.

収録刊行物

  • 分析化学

    分析化学 39 (7), T107-T112, 1990

    公益社団法人 日本分析化学会

被引用文献 (1)*注記

もっと見る

キーワード

詳細情報 詳細情報について

問題の指摘

ページトップへ