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On Standardizing to Voltammetric Determination of Cupric and Cuprous Oxides Formed on Copper.
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- NAKAYAMA Shigeyoshi
- Analysis Technology Research Center, Sumitomo Electric Industries, Ltd.
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- SHIBATA Masahiro
- Analysis Technology Research Center, Sumitomo Electric Industries, Ltd.
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- NOTOYA Takenori
- Molecular Science Division, Graduate School of Engineering, Hokkaido University
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- OSAKAI Toshiyuki
- Department of Chemistry, Faculty of Science, Kobe University
Bibliographic Information
- Other Title
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- 銅表面に生成した酸化第一銅及び酸化第二銅のボルタンメトリー測定の標準化に関する研究
- ドウ ヒョウメン ニ セイセイ シタ サンカ ダイ1ドウ オヨビ サンカ ダイ2ドウ ノ ボルタンメトリー ソクテイ ノ ヒョウジュンカ ニ カンスル ケンキュウ
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Description
The quantitative characterization of oxide films formed on copper is an important subject in corrosion research. So far, chronopotentiometry has been most frequently applied to the selective determination of cuprous oxide (Cu2O) and cupric oxide (CuO) in copper oxide films. However, it is time-consuming, and has a serious problem that there are two different doctrines about which oxide is reduced first. In this study, we prepared two standard samples of Cu2O film (Dumet wires) and CuO film (by treating a copper sheet with a commercial oxidizing agent) and also a real sample in which the two oxides coexist on a copper sheet. We then performed quantitative analyses of the oxide films using a recently proposed voltammetric technique, i.e., double-sweep cyclic voltammetry (DSCV). It was found that the use of a strongly alkaline solution (i.e., 6 M KOH+1 M LiOH) allowed a perfect separation between two cathodic peaks due to the reductions of Cu2O and CuO. One of the peaks, appearing at a less negative potential, was due to the reduction of CuO to Cu, whereas the other peak, appearing at a more negative potential, was due to the reduction of Cu2O to Cu. These peak assignments have been justified by analyses of standard samples by X-ray diffraction, inert-gas fusion analysis for oxygen, and scanning ion microscopy (SIM). Also, the thickness of the oxide layer of each standard sample, calculated from the peak area, was in fair agreement with that estimated by either gas analysis or the SIM image.
Journal
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- BUNSEKI KAGAKU
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BUNSEKI KAGAKU 51 (12), 1145-1151, 2002
The Japan Society for Analytical Chemistry
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Keywords
Details 詳細情報について
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- CRID
- 1390282679028930816
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- NII Article ID
- 110002905028
- 10031070063
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- NII Book ID
- AN00222633
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- COI
- 1:CAS:528:DC%2BD38XpslCgu7w%3D
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- NDL BIB ID
- 6405851
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- ISSN
- 05251931
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- Crossref
- NDL Digital Collections (NII-ELS)
- CiNii Articles
- OpenAIRE
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- Abstract License Flag
- Disallowed