Glow discharge mass spectrometric analysis of nickel-based heat-resisting alloys.

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Other Title
  • グロー放電質量分析法によるニッケル基耐熱合金の分析
  • グローホウデン シツリョウ ブンセキホウ ニヨル ニッケルキ タイネツ ゴウキ
  • グロー放電質量分析法によるニッケル基耐熱合金の分析(<特集>質量分析法の応用技術)

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Description

GD-MS analysis of nickel-based heat-resisting alloys has been performed using a VG 9000 glow discharge (GD) mass spectrometer. Concentrations of not only alloying elements (Al, Si, Ti, V, Cr, Mn, Fe, Co, Cu, Y, Nb, Mo and W) but also trace elements (B, C, Mg, P, S, Zn, Ga, As, Zr, Cd, Sn, Sb, Te, Pb and Bi) were successfully determined in disk shaped samples. The examination of spectral interference confirmed the following. The influence of manganese argide (55Mn40Ar+) on the ion beam intensity of 95Mo+ was negligible because manganese content of the alloys is usually less than 1 mass%. Mass spectra of 31P+ and 32S+ may be affected by the spectral interference of 62Ni2+ and 64Ni2+, respectively, due to the matrix element. However, these ion species were sufficiently separated at the mass resolution 5000 (m/Δm, at 5% peak height) used in this study. Relative sensitivity factors (RSFs) were determined by analyzing standard reference materials: JAERI CRMs, a NIST SRM, a BS CRM, BCS CRMs and the alloys prepared in our Institute. The average RSF-values obtained for Ni=1 were 0.436 for Al, 0.826 for Si, 0.281 for Ti, 0.375 for V, 1.480 for Cr, 1.122 for Mn, 0.754 for Fe, 0.653 for Co, 3.321 for Cu, 0.303 for Y, 0.436 for Nb, 0.862 for Mo, 0.935 for Ta and 1.052 for W. The analytical accuracy (σd) obtained was comparable to that of FP-XRF analysis, except for chromium and iron determinations. Relative standard deviations (RSDs) of five replicate measurements were within about 2.5%, except for phosphorus (P;0.003 mass%, RSD; 3.31%) and sulfur (S; 0.005 mass%, RSD; 3.08%). GD-MS analytical values for ODS MA6000 alloy were obtained using a RSF correction program, and the values were in good agreement with those obtained by FP-XRF and by chemical analysis.

Journal

  • BUNSEKI KAGAKU

    BUNSEKI KAGAKU 45 (6), 529-536, 1996

    The Japan Society for Analytical Chemistry

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