Diagnostic Nano-scale Analysis of Electronic Structures by Complex Electron Spectroscopic Methods
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- Muto Shunsuke
- Graduate School of Engineering, Nagoya University
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- Yoshida Tomoko
- Graduate School of Engineering, Nagoya University
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- Tatsumi Kazuyoshi
- Graduate School of Engineering, Nagoya University
Bibliographic Information
- Other Title
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- 複合電子分光による機能元素分析と物性画像診断
- フクゴウ デンシ ブンコウ ニ ヨル キノウ ゲンソ ブンセキ ト ブッセイ ガゾウ シンダン
Search this article
Journal
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- Materia Japan
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Materia Japan 48 (6), 290-293, 2009
The Japan Institute of Metals and Materials
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Keywords
Details 詳細情報について
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- CRID
- 1390282679032915456
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- NII Article ID
- 10024817416
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- NII Book ID
- AN10433227
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- COI
- 1:CAS:528:DC%2BD1MXntlOnurY%3D
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- ISSN
- 18845843
- 13402625
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- NDL BIB ID
- 10332765
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
