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- MICHIZONO Shinichiro
- KEK, High Energy Accelerator Research Organization, Tsukuba
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- SAITO Yoshio
- KEK, High Energy Accelerator Research Organization, Tsukuba
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- INAGAKI Atushi
- NGK Spark Plug Co.
書誌事項
- タイトル別名
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- Annealing Effects on Breakdown Threshol
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The breakdown threshold of alumina rf windows depends not only on the bulk characteristics, but also on surface treatments such as polishing and annealing. Sapphire and alumina-ceramic disks, polished and annealed, were examined by high-power tests. The polished disk exhibited a lower threshold value than the annealed one, probably due to its surface charging at defects mechanically introduced by polishing. The elimination of the charged sites present on the surface is considered to be important.
収録刊行物
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- 真空
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真空 40 (5), 436-441, 1997
一般社団法人 日本真空学会
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詳細情報 詳細情報について
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- CRID
- 1390282679040125824
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- NII論文ID
- 10001958946
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- NII書誌ID
- AN00119871
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- ISSN
- 18809413
- 05598516
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- NDL書誌ID
- 4247799
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可