Annealing Effects on Breakdown Threshold of Radio-frequency Windows.
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- MICHIZONO Shinichiro
- KEK, High Energy Accelerator Research Organization, Tsukuba
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- SAITO Yoshio
- KEK, High Energy Accelerator Research Organization, Tsukuba
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- INAGAKI Atushi
- NGK Spark Plug Co.
Bibliographic Information
- Other Title
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- Annealing Effects on Breakdown Threshol
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Abstract
The breakdown threshold of alumina rf windows depends not only on the bulk characteristics, but also on surface treatments such as polishing and annealing. Sapphire and alumina-ceramic disks, polished and annealed, were examined by high-power tests. The polished disk exhibited a lower threshold value than the annealed one, probably due to its surface charging at defects mechanically introduced by polishing. The elimination of the charged sites present on the surface is considered to be important.
Journal
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- Shinku
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Shinku 40 (5), 436-441, 1997
The Vacuum Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390282679040125824
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- NII Article ID
- 10001958946
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- NII Book ID
- AN00119871
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- ISSN
- 18809413
- 05598516
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- NDL BIB ID
- 4247799
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed