FIM Observations of Pd/M(M:W,Mo,Ta,Nb) Atomic Interfaces and Pd Growth Layer.
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- OKUNO Kimio
- Department of Electrical Engineering, Nagasaki Inst. of Appl. Science
Bibliographic Information
- Other Title
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- Ｐｄ／Ｍ（Ｍ：Ｗ，Ｍｏ，Ｔａ，Ｎｂ）原子界面とＰｄ成長層のＦＩＭ観察
- Pd M M W Mo Ta Nb ゲンシ カイメン ト Pd セイチョウソウ
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Abstract
The growth processes and the atomic structure of Pd ultra-thin films vapor deposited on the substrate metals (W, Mo, Ta, Nb), and a hydrogen interaction with the Pd monolayer film were investigated by a field ion microscope (FIM) with atomically high resolution. The Pd monolayer on the substrate metals exhibits a pseudomorphic structure which has an atomic arrangement identical to the substrate and is strongly bound with the substrate metal atoms. The desorption field strengths of the pseudomorphic Pd monolayer on W (011), Mo (011), Ta (011) and Nb (011) planes were measured. The fields depend strongly on the evaporation fields of the substrate metals and are higher than the evaporation field of Pd. In the growth of the Pd films, the two different Pd structures are observed. The observed structures are the Pd overlayer grown with the Pd inherent atomic structure and the stable pseudomorphic Pd underneath. Hydrogen interactions with the pseudomorphic Pd monolayer grown on W (011) and Mo (011) planes were also studied.
Journal
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- Shinku
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Shinku 36 (8), 650-656, 1993
The Vacuum Society of Japan
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Details 詳細情報について
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- CRID
- 1390282679040648064
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- NII Article ID
- 10007960163
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- NII Book ID
- AN00119871
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- ISSN
- 18809413
- 05598516
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- NDL BIB ID
- 3834298
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed
