Deposition Equipment for X-ray Reflective Films and Characterization of the Films.
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- ITABASHI Seiichi
- NTT LSI Laboratories
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- OKADA Ikuo
- NTT LSI Laboratories
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- YOSHIHARA Hideo
- NTTアドバンステクノロジ (株)
Bibliographic Information
- Other Title
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- X線反射膜形成装置と反射膜特性
- Xセン ハンシャ マク ケイセイ ソウチ ト ハンシャ マク トクセイ
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Abstract
To fabricate highly reflective X-ray mirrors coated with metal films, we have developed a deposition system equipped with an electron cyclotron resonance (ECR) ion source to irradiate a substrate with low-energy ions as well as to sputter the metal target. The ECR ion source has been designed to avoid depositing a metal film onto a microwave-introducing window. This design has enabled us to stably deposit metal films, suggesting wide-area X-ray mirrors. A platinum film with a surface roughness of 0.3 nm has been deposited by means of this equipment, which should ensure high-reflectivity X-ray mirrors.
Journal
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- Shinku
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Shinku 36 (1), 32-39, 1993
The Vacuum Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390282679042094464
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- NII Article ID
- 10007955448
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- NII Book ID
- AN00119871
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- ISSN
- 18809413
- 05598516
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- NDL BIB ID
- 3812410
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed