Nitridation Mechanisms on Si(100) through Strong N Condensation
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- KATO Koichi
- Advanced LSI Technology Laboratory Toshiba R & D Center
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- MATSUSITA Daisuke
- Advanced LSI Technology Laboratory Toshiba R & D Center
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- MURAOKA Koichi
- Advanced LSI Technology Laboratory Toshiba R & D Center
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- NAKASAKI Yasushi
- Advanced LSI Technology Laboratory Toshiba R & D Center
Bibliographic Information
- Other Title
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- 窒素の強凝集によるSi(100)窒化膜形成機構
- チッソ ノ キョウギョウシュウ ニ ヨル Si 100 チッカマク ケイセイ キコウ
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Abstract
We studied N condensation behaviors in crystalline Si. N atoms introduced rapidly on Si(100) generate SiN agglomerated structures. We found that this agglomeration is induced by charge transfer between Si and N atoms, which is much stronger than those of silicon oxidation. N atoms introduced slowly on Si(100), however, stay at around the third layer from the topmost surface, leading likely to a stable Si-N network layer at around the same layer. This layer can be a seed layer for layer-by-layer Si3N4 growth on Si(100) along the vertical direction to the surface. Agglomeration and uniform growth of Si3N4 growth have been clearly observed by experimental techniques.<br>
Journal
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- Shinku
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Shinku 50 (11), 652-658, 2007
The Vacuum Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390282679044187648
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- NII Article ID
- 10020009808
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- NII Book ID
- AN00119871
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- ISSN
- 18809413
- 05598516
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- NDL BIB ID
- 9303622
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed