Calibration of 253.7nm irradiance based on the silicon photodiode selfcalibration technique
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- Ohkubo Kazuaki
- Matsushita Electric Ind. Co., Ltd.
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- Ohno Yoshihiro
- Matsushita Electric Ind. Co., Ltd.
Bibliographic Information
- Other Title
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- シリコンフォトダイオードの自己校正法に基づいた253.7nm放射の絶対測定
Journal
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- JOURNAL OF THE ILLUMINATING ENGINEERING INSTITUTE OF JAPAN
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JOURNAL OF THE ILLUMINATING ENGINEERING INSTITUTE OF JAPAN 72 (Appendix), 118-118, 1988
The Illuminating Engineering Institute of Japan
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Details 詳細情報について
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- CRID
- 1390282679061269632
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- NII Article ID
- 130006764595
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- ISSN
- 1349838X
- 21851506
- 00192341
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- Data Source
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- JaLC
- Crossref
- CiNii Articles