書誌事項
- タイトル別名
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- X-Ray Standing Wave in Resonant Dynamical Diffraction.
- キョウメイ サンラン ドウリキガク カイセツ ニ オケル Xセン テイザイハ
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X-ray standing wave method is widely used for determination of atomic position of an adsorbate at surface, an impurity atom in a bulk or an atom at an interface. If the method is combined with X-ray resonant scattering, novel applications are expected as the resonant scattering occurs in a very narrow region of X-ray energy, and the scattering factor and its phase varies in the region. In addition, the improvement in accuracy of atomic positions is expected. The principle idea of X-ray standing wave with resonant scattering is described, together with the variations of X-ray wavef eld around resonant condition both in the Bragg and Laue cases. Change in the fluorescent X-ray emission from GaAs is described as an example to show the variation of the wavefeld.
収録刊行物
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- 日本結晶学会誌
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日本結晶学会誌 42 (6), 497-503, 2000
日本結晶学会
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詳細情報 詳細情報について
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- CRID
- 1390282679063530880
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- NII論文ID
- 10007410678
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- NII書誌ID
- AN00188364
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- ISSN
- 18845576
- 03694585
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- NDL書誌ID
- 5611211
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- CiNii Articles
- KAKEN
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- 抄録ライセンスフラグ
- 使用不可