共鳴散乱動力学回折におけるX線定在波

書誌事項

タイトル別名
  • X-Ray Standing Wave in Resonant Dynamical Diffraction.
  • キョウメイ サンラン ドウリキガク カイセツ ニ オケル Xセン テイザイハ

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抄録

X-ray standing wave method is widely used for determination of atomic position of an adsorbate at surface, an impurity atom in a bulk or an atom at an interface. If the method is combined with X-ray resonant scattering, novel applications are expected as the resonant scattering occurs in a very narrow region of X-ray energy, and the scattering factor and its phase varies in the region. In addition, the improvement in accuracy of atomic positions is expected. The principle idea of X-ray standing wave with resonant scattering is described, together with the variations of X-ray wavef eld around resonant condition both in the Bragg and Laue cases. Change in the fluorescent X-ray emission from GaAs is described as an example to show the variation of the wavefeld.

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