Its Features, Applications and Future Prospects

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  • MUTO Shunsuke
    名古屋大学大学院工学研究科マテリアル理工学専攻

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  • 電子線で今何ができるか１．電子線結晶構造解析の最先端　　ＴＥＭ‐ＥＸＥＬＦＳ法の特徴とその応用の現状と展望
  • TEM EXELFSホウ ノ トクチョウ ト ソノ オウヨウ ノ ゲンジョウ ト テンボウ

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Abstract

In this short article the features of extended energy-loss fine structure (EXELFS) in electron energy-loss spectroscopy (EELS) associated with transmission electron microscopy (TEM) are introduced as one of the useful methods for structural analysis in a localized area. After briefly describing the principle and analysis method of EXELFS, several interesting application examples of EXELFS in materials science are presented. Finally the standing problems in EXELFS analysis and future prospects are addressed.

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