Critical Phenomena and Degeneracies Observed in Electron Diffraction
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- MATSUHATA Hirofumi
- National Institute of Advanced Industrial Science and Technology, Nanoelectronics Research Institute
Bibliographic Information
- Other Title
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- 電子回折で観察される縮退と臨界現象(2)
- デンシ カイセツ デ カンサツ サレル シュクタイ ト リンカイ ゲンショウ 2
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Abstract
Bloch wave degeneracies, which can be observed in high-energy electron diffraction, are summarized. Critical voltages of non-systematic reflections for 4 beam and 5 beam cases, and zone axis critical voltage effect are discussed. Bloch wave degeneracy observed in non-symmorphic space group is explained. Pseudo-critical voltage effect observed in non-centrosymmetric crystal is also discussed. The experimental measurement of the degeneracy is mentioned briefly. Examples of application of the critical voltage effect for estimation of accurate structure factors are discussed.
Journal
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- Nihon Kessho Gakkaishi
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Nihon Kessho Gakkaishi 46 (4), 276-285, 2004
The Crystallographic Society of Japan
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Details 詳細情報について
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- CRID
- 1390282679064704128
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- NII Article ID
- 10013526774
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- NII Book ID
- AN00188364
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- ISSN
- 18845576
- 03694585
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- NDL BIB ID
- 7080039
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed