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Electron Energy-Loss Spectroscopy Based on Transmission Electron Microscope
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- TERAUCHI Masami
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
Bibliographic Information
- Other Title
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- EELSで何がわかるのか?
- デンシ ケンビキョウ ニュウモン コウザ チュウキュウヘン トウカ デンシ ケンビキョウ ノ センシン キノウ オ モット カツヨウ シヨウ 3 EELS デ ナニ ガ ワカル ノ カ
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Description
Analysis methods of electron energy-loss spectroscopy (EELS) based on transmission electron microscopy are described. An introduction includes a short history, types of spectrometers and advantageous points of EELS. Thickness determination and elemental analysis methods are briefly described. Information of electronic structures appearing in valence-loss spectra is explained using spectra of graphite, C60 and diamond. Characteristic effects on core-loss spectra of the selection rule, on site excitation, chemical shift and core-hole interaction are explained.
Journal
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- Nihon Kessho Gakkaishi
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Nihon Kessho Gakkaishi 44 (5), 277-283, 2002
The Crystallographic Society of Japan
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Details 詳細情報について
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- CRID
- 1390282679066896000
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- NII Article ID
- 10010393721
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- NII Book ID
- AN00188364
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- ISSN
- 18845576
- 03694585
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- NDL BIB ID
- 6348644
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
- OpenAIRE
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- Abstract License Flag
- Disallowed