Bibliographic Information
- Other Title
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- 暗減衰過渡分光法におけるPoole-Frenkel効果の影響
- アンゲンスイ カト ブンコウホウ ニ オケル Poole Frenkel コウ
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Description
Depletion discharge transient spectroscopy (DDTS)1) has been modified by taking account of the Poole-Frenkel (P-F) effect. It's numerical calculation shows that the spatially uniform electric field simply determined from the surface potential and film thickness provides the fairly faithful emission states distribution with the strong P-F effect. This method has been applied to the analysis of DDTS spectra strongly affected by the P-F effect for amorphous silicon photoreceptors. The result indicates that the density of electron emission states is 4×1015 eV-1cm-3 around 0.8 eV and increases up to 2×1016 eV-1cm-3 as the energy level deepens to the midgap.
Journal
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- DENSHI SHASHIN GAKKAISHI (Electrophotography)
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DENSHI SHASHIN GAKKAISHI (Electrophotography) 33 (3), 202-208, 1994
The Imaging Society of Japan
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Details 詳細情報について
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- CRID
- 1390282679074252288
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- NII Article ID
- 130004484659
- 40004298227
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- NII Book ID
- AN00261409
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- ISSN
- 18805108
- 0387916X
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- NDL BIB ID
- 3907797
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- CiNii Articles
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- Abstract License Flag
- Disallowed