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- NAGAMI Hatsutaro
- Central Research Laboratory. Tokyo Shibaura Electric C., Ltd.
Bibliographic Information
- Other Title
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- セレン感光板のX線特性に対する考察
- セレン カンコウバン ノ Xセン トクセイ ニ タイスル コウサツ
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Description
The dark and light current-characteristics of Xeroradiographic plates have been considered by the theoretical and preliminary experimental investigation.<br/> The relations between the surface potential on the plates and the dv/dt in a dark decay curve have approximately indicated an exponential curve. Therefore, an RC model cannot fit to it.<br/> The X-ray decay characteristics of Xeroradiographic plates in X-ray radiation are disclosed as follows: <img align="middle" src="./Graphics/abst-eq1_4_1_3.png"/>, <br/>where E is the X-ray energy, φ is X-ray density, β is the X-ray energy absorption coefficient, L is the thickness of selenium film, μ is the mobility of carrier and F(t) is the factor to time in which the effects owing to trapping carriers, recombination of carriers and radiation of secondary electrons have been included.<br/>Results are that the photosensitivity in X-ray radiation has proportionately increased with the thickness of selenium film and X-ray energy absorption coefficient and X-ray dose rate.
Journal
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- DENSHI SHASHIN (Electrophotography)
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DENSHI SHASHIN (Electrophotography) 4 (1), 1_3-1_6, 1962
The Imaging Society of Japan
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Details 詳細情報について
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- CRID
- 1390282679075211008
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- NII Article ID
- 130004800254
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- NII Book ID
- AN00153188
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- ISSN
- 18805094
- 00118478
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- NDL BIB ID
- 9120696
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- CiNii Articles
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- Abstract License Flag
- Disallowed