X-Ray Photoelectron Spectroscopy
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- INOUE Risayo
- ULVAC-PHI, Inc.
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- SANADA Noriaki
- ULVAC-PHI, Inc.
Bibliographic Information
- Other Title
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- X線光電子分光法
- 最新表面科学講座(第21講)X線光電子分光法
- サイシン ヒョウメン カガク コウザ(ダイ21コウ)Xセン コウデンシ ブンコウホウ
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Description
X-ray photoelectron spectroscopy (XPS; also known as ESCA: Electron Spectroscopy for Chemical Analysis) is one of the most widely used surface analysis techniques. XPS provides the chemical information of solid surface with a depth of several nm (several tens of atomic layers). In this lecture paper, we provide the simplified principle of XPS, common knowledge of measurement method, and its application to pigment materials and devices.
Journal
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- Journal of the Japan Society of Colour Material
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Journal of the Japan Society of Colour Material 87 (2), 59-63, 2014
Japan Society of Colour Material
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Details 詳細情報について
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- CRID
- 1390282679115720960
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- NII Article ID
- 130004516280
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- NII Book ID
- AN00354634
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- ISSN
- 18832199
- 0010180X
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- NDL BIB ID
- 025289732
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed