Dielectric Dispersion of Valence Fluctuation Compound Sm3Se4
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- Goto Hideaki
- Research Institute for Scientific Measurements, Tohoku University
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- Baba Kenzo
- Research Institute for Scientific Measurements, Tohoku University
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- Goto Terutaka
- Research Institute for Scientific Measurements, Tohoku University
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- Nakamura Shintaro
- Research Institute for Scientific Measurements, Tohoku University
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- Tamaki Akira
- Department of Applied Science, Tokyo Denki University
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- Ochiai Akira
- Institute for Materials Research, Tohoku University
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- Suzuki Takashi
- Department of Physics, Tohoku University
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- Kasuya Tadao
- Department of Physics, Tohoku University
書誌事項
- タイトル別名
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- Dielectric Dispersion of Valence Fluctuation Compound Sm<SUB>3</SUB>Se<SUB>4</SUB>
- Dielectric Dispersion of Valence Fluctu
- Dielectric Dispersion of Valence Fluctuation Compound Sm<sub><b>3</b></sub>Se<sub><b>4</b></sub>
- 公開日
- 1993
- DOI
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- 10.1143/jpsj.62.1365
- 公開者
- 一般社団法人 日本物理学会
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説明
The dielectric response of valence fluctuation compound Sm3Se4 has been measured in the frequency range from 20 Hz up to 1 GHz. The resultant response of Sm3Se4 is described by a superposition of two independent dispersions with the Cole-Cole type, which are given by the valence fluctuating state in Sm3Se4 crystal with vacancies. The phase angle θ=90° for the admittance of Sm3Se4 at low temperatures leads the absence of free carrier like in an ideal capacitor. Similar behavior on Sm2Se3 is also presented.
収録刊行物
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- Ｊｏｕｒｎａｌ ｏｆ ｔｈｅ Ｐｈｙｓｉｃａｌ Ｓｏｃｉｅｔｙ ｏｆ Ｊａｐａｎ
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Ｊｏｕｒｎａｌ ｏｆ ｔｈｅ Ｐｈｙｓｉｃａｌ Ｓｏｃｉｅｔｙ ｏｆ Ｊａｐａｎ 62 (4), 1365-1371, 1993
一般社団法人 日本物理学会
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詳細情報 詳細情報について
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- CRID
- 1390282679153667584
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- NII論文ID
- 110001955907
- 210000097313
- 130003901946
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- NII書誌ID
- AA00704814
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- BIBCODE
- 1993JPSJ...62.1365G
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- COI
- 1:CAS:528:DyaK3sXis1CltL4%3D
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- ISSN
- 13474073
- 00319015
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- NDL書誌ID
- 3819990
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- 本文言語コード
- en
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- データソース種別
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- NDLサーチ
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