Effects of Randomness on Tunnel Conductance and Magnetoresistance in Ferromagnetic Tunnel Junctions
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- Itoh Hiroyoshi
- Department of Quantum Engineering, Nagoya University, Nagoya 464–8603
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- Shibata Akinori
- Department of Applied Physics, Nagoya University, Nagoya 464–8603
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- Kumazaki Takao
- Department of Applied Physics, Nagoya University, Nagoya 464–8603
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- Inoue Jun–ichiro
- Department of Applied Physics, Nagoya University, Nagoya 464–8603
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- Maekawa Sadamichi
- Institute for Materials Research, Tohoku University, Sendai 980–8577
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説明
The effects of randomness on the tunnel conductance and the tunnel magnetoresistance (TMR) are studied theoretically for ferromagnetic tunnel junctions. An emphasis is put on a combined effects of the interfacial randomness and the electronic structures of the metallic leads. The conductance is formulated by taking the randomness into account at T=0 K and zero bias limit by using the Kubo formula and the coherent potential approximation in a single orbital tight-binding model. The vertex correction to the conductance is calculated so as to satisfy the current conservation law. The tunnel conductance and the TMR with and without randomness are found to depend on the Fermi energy EF and the shape of the Fermi surface. The TMR is affected by the randomness in such a way that it can be increased by the randomness when EF is close to the band bottom, while it is decreased when EF is higher. The variation of the TMR with the barrier height and thickness is also calculated.
収録刊行物
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- Journal of the Physical Society of Japan
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Journal of the Physical Society of Japan 68 (5), 1632-1639, 1999
一般社団法人 日本物理学会
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詳細情報 詳細情報について
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- CRID
- 1390282679159032192
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- NII論文ID
- 110001978742
- 130004537120
- 210000101591
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- NII書誌ID
- AA00704814
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- BIBCODE
- 1999JPSJ...68.1632I
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- ISSN
- 13474073
- 00319015
- http://id.crossref.org/issn/00319015
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- NDL書誌ID
- 4730330
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDLサーチ
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- 抄録ライセンスフラグ
- 使用不可