Size Effects on the Spin Density Wave in Cr Films

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  • Hara Hitoshi
    Department of Instrumentation Engineering, Faculty of Engineering, Keio University
  • Sakata Makoto
    Department of Instrumentation Engineering, Faculty of Engineering, Keio University

書誌事項

タイトル別名
  • Size Effects on the Spin Density Wave i
公開日
1977
DOI
  • 10.1143/jpsj.43.468
公開者
一般社団法人 日本物理学会

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説明

Thin films of Cr were deposited on glass substrates at 20°C, 50°C, 100°C and 250°C in a vacuum of about 5×10−5 Torr. Their structural and electrical properties were investigated by means of the transmission-electron microscopy, electron diffraction and resistivity measurement. Films deposited at 100°C show the same anomaly in the electrical resistivity as that observed in the plastically deformed Cr. The Néel temperature TN, obtained from the resistivity anomaly, increases with decreasing film thickness. This shift in TN, being related to the tension due to the residual strain developed in the films, is explained in terms of the variation of the critical yield stress. In relation to the uncommensurate-commensurate transition of the spin density wave, a discussion is made on the extremely large anomaly in the resistivity of films deposited at 20°C, which consist of very fine sub-grains with an average diameter smaller than the period of the spin density wave.

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