Force Microscopy Imaging of Rest Atom on Si(111)7×7 Surface under Strong Tip–Surface Interaction
-
- Naitoh Yoshitaka
- Department of Applied Physics, Graduate School of Engineering, Osaka University
-
- Momotani Kohji
- Department of Applied Physics, Graduate School of Engineering, Osaka University
-
- Nomura Hikaru
- Department of Applied Physics, Graduate School of Engineering, Osaka University
-
- Li Yan Jun
- Department of Applied Physics, Graduate School of Engineering, Osaka University
-
- Kageshima Masami
- Department of Applied Physics, Graduate School of Engineering, Osaka University
-
- Sugawara Yasuhiro
- Department of Applied Physics, Graduate School of Engineering, Osaka University
書誌事項
- タイトル別名
-
- Force Microscopy Imaging of Rest Atom on Si 111 7 7 Surface under Strong Tip Surface Interaction
この論文をさがす
抄録
We investigated NC-AFM imaging mechanism on a Si(111)7×7 surface under the strong interaction condition working between dangling bonds on the tip and the surface atoms. The surface adatom appeared in the image as a bright spot, which became larger with stronger interaction condition. Upon further strong interaction, we could detect the rest atoms in the unfaulted half unit of the 7×7 surface image as prominent sharp bright dots with 1 Å width. Besides, the dot appeared with the lateral shift by 2 Å as compared to the surface adatom image. We found the strong covalent interaction between the dangling bonds on the tip atom and the surface atoms influenced onto the image variation.
収録刊行物
-
- Journal of the Physical Society of Japan
-
Journal of the Physical Society of Japan 76 (3), 033601-033601, 2007
一般社団法人 日本物理学会
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1390282679170781312
-
- NII論文ID
- 130005296650
- 110006240183
- 210000106571
-
- NII書誌ID
- AA00704814
-
- ISSN
- 13474073
- 00319015
-
- NDL書誌ID
- 8688264
-
- 本文言語コード
- en
-
- データソース種別
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可