Intensity Distribution in Equal-Thickness Fringes in Electron Micrograph
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- Takagi Satio
- College of General Education, University of Tokyo
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- Ishida Kohtaro
- College of General Education, University of Tokyo
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抄録
Equal-thickness fringes in electron micrographs of aluminium single-crystal films have been energy-analysed. The intensity distribution in an ordinary E. M. image and that of electrons with negligible energy-loss have been measured. A phenomenological theory taking account of inelastic intra- and inter-band transitions and quasi-elastic inter-band transitions has been developed in good agreement with the experimental results. Reasonable values of the probabilities of these transitions are obtained.
収録刊行物
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- Ｊｏｕｒｎａｌ ｏｆ ｔｈｅ Ｐｈｙｓｉｃａｌ Ｓｏｃｉｅｔｙ ｏｆ Ｊａｐａｎ
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Ｊｏｕｒｎａｌ ｏｆ ｔｈｅ Ｐｈｙｓｉｃａｌ Ｓｏｃｉｅｔｙ ｏｆ Ｊａｐａｎ 28 (4), 1023-1030, 1970
一般社団法人 日本物理学会
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詳細情報 詳細情報について
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- CRID
- 1390282679171417216
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- NII論文ID
- 110001961283
- 210000081476
- 130003892592
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- NII書誌ID
- AA00704814
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- BIBCODE
- 1970JPSJ...28.1023T
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- COI
- 1:CAS:528:DyaE3cXhtFGmt7c%3D
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- ISSN
- 13474073
- 00319015
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- NDL書誌ID
- 8502397
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可