Comments on the revised “GAKUSHIN” method

Iwashita Norio

doi:10.7209/tanso.2006.48

X-ray diffraction techniques have been widely applied to the structural characterization of carbon materials and have given useful information. In 1963, the 117 Committee of the Japan Society for the Promotion of Sciences (Gakushin) specified standard procedures for the determination of lattice constants and crystallite sizes of carbon materials, especially graphitized materials. This specification has been called the “Gakushin” method and is commonly used in Japan.<BR>Progress in computers has been remarkable, making the measurement of diffraction intensities and their corrections for different factors easier. In 2002, the 117 Committee began discussing the revision of the specification using the proposals of Dr. H. Fujimoto, in order to incorporate modem computing processes such as the automatic step-scanning measurements of diffraction intensities, profile fitting for diffraction lines, etc. On the basis of round-robin tests and their results and discussion, the specification of the Gakushin method was revised by a group of the 117 Committee. In this report, the revisions of the Gakushin method are introduced.

Comments on the revised “GAKUSHIN” method

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