Applications of EFTEM Elemental Mapping with High Spatial Resolution to the Nanocavity and Modulated Structure
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- Gao Min
- Beijing Laboratory of Electron Microscopy, Institute of Physics & Center for Condensed Matter Physics, Chinese Academy of Sciences
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- Duan X. F.
- Beijing Laboratory of Electron Microscopy, Institute of Physics & Center for Condensed Matter Physics, Chinese Academy of Sciences
書誌事項
- タイトル別名
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- Applications of EFTEM Elemental Mapping
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Elemental mapping with high spatial resolution can be performed efficiently in an energy-filtering transmission electron microscope (EFTEM) with a field emission gun (FEG). In this work we have used an imaging filter which is attached to a 200 kV FEG TEM to acquire elemental maps using inner-shell ionization edges. Gettering of oxygen and carbon to the internal surfaces of the nanocavities in hydrogen implanted and annealed silicon, compositional modulation of Al in a Cu–Zn–Al–Zr phase in a shape memory alloy (SMA), and slight diffusion at the Mo/SiO2 multilayer interface have been revealed.
収録刊行物
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- Materials Transactions, JIM
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Materials Transactions, JIM 39 (9), 883-887, 1998
社団法人 日本金属学会
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詳細情報 詳細情報について
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- CRID
- 1390282679222934016
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- NII論文ID
- 130003557080
- 10003803678
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- NII書誌ID
- AA10699969
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- COI
- 1:CAS:528:DyaK1cXnt1Okt78%3D
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- ISSN
- 2432471X
- 09161821
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- NDL書誌ID
- 4583302
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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- 使用不可