XPS Study of the Effect of Ar-Ion Bombardment and Aging on Surface Properties of Superionic Conducting Glass (CuI)0.3(Cu2O)0.35(MoO3)0.35
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- Suzuki Shigeru
- Institute for Advanced Materials Processing, Tohoku University
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- Saito Masatoshi
- Institute for Advanced Materials Processing, Tohoku University
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- Kang Shinchul C.
- Institute for Advanced Materials Processing, Tohoku University
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- Jacob Kallarackel T.
- Institute for Advanced Materials Processing, Tohoku University
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- Waseda Yoshio
- Institute for Advanced Materials Processing, Tohoku University
書誌事項
- タイトル別名
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- XPS Study of the Effect of Ar-Ion Bombardment and Aging on Surface Properties of Superionic Conducting Glass (CuI)<SUB>0.3</SUB>(Cu<SUB>2</SUB>O)<SUB>0.35</SUB>(MoO<SUB>3</SUB>)<SUB>0.35</SUB>
- XPS Study of the Effect of Ar-Ion Bomba
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説明
XPS analysis has been used for characterizing the effects of argon-ion bombardment and aging at room temperature on the surface properties of the superionic conducting glass having the composition (CuI)0.3(Cu2O)0.35(MoO3)0.35. Copper and molybdenum ions in this particular glass are found to be significantly reduced by argon-ion bombardment, Cu2+ to Cu0 and Mo6+ to Mo4+. The chemical change is attributed to preferential sputtering of iodine and oxygen from the surface of the glass. The concentration of copper on the surface increases and that of molybdenum decreases with aging at room temperature. From aging curves, the diffusion coefficient of copper is estimated to be of the order of 10−23 m2·s−1.
収録刊行物
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- Materials Transactions, JIM
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Materials Transactions, JIM 39 (10), 1024-1028, 1998
社団法人 日本金属学会
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詳細情報 詳細情報について
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- CRID
- 1390282679224762624
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- NII論文ID
- 130003556984
- 10003804299
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- NII書誌ID
- AA10699969
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- COI
- 1:CAS:528:DyaK1MXnsFyq
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- ISSN
- 2432471X
- 09161821
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- NDL書誌ID
- 4587175
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可