Surface Evolution during Focused Ion Beam Micro-Machining in (001) Plane of Single-Crystalline Ni and Amorphous Nickel Alloy
-
- Hosokawa Hiroyuki
- Materials Research Institute for Sustainable Development, National Institute of Advanced Industrial Science and Technology (AIST)
-
- Nakajima Takeshi
- Materials Research Institute for Sustainable Development, National Institute of Advanced Industrial Science and Technology (AIST)
-
- Shimojima Koji
- Materials Research Institute for Sustainable Development, National Institute of Advanced Industrial Science and Technology (AIST)
-
- Mabuchi Mamoru
- Department of Energy Science and Technology, Kyoto University
この論文をさがす
抄録
A focused Ga+ ion beam (30 keV and 187 pA) have been irradiated at doses of 8.92×1016–2.68×1018 ions/cm2 in (001) plane of a single-crystalline Ni and an amorphous Ni75B15Si10 alloy and their surface evolution was investigated by atomic force microscopy. The root-mean-square (rms) roughness increased with increasing ion dose and the transition of surface morphology from dot structure to ripple structure occurred during FIB machining in the single-crystalline Ni. However, the amorphous Ni75B15Si10 alloy showed no such transition of surface morphology and held the rms roughness almost constant in an ion dose range more than about 1×1017 ions/cm2. Therefore, it is suggested that surface diffusion, which is the primary smoothing mechanism for crystalline surfaces, plays an important role in smoothening during FIB machining when the ion dose is low, while viscous flow, which is dominant for amorphous surfaces, contributes to smoothening when the ion dose is large.
収録刊行物
-
- MATERIALS TRANSACTIONS
-
MATERIALS TRANSACTIONS 46 (10), 2295-2297, 2005
公益社団法人 日本金属学会
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1390282679227495552
-
- NII論文ID
- 130004452627
- 10018277992
-
- NII書誌ID
- AA1151294X
-
- ISSN
- 13475320
- 13459678
-
- NDL書誌ID
- 7488082
-
- 本文言語コード
- en
-
- データソース種別
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可