Baseline Noise and Measurement Uncertainty in Liquid Chromatography
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- KITAJIMA Akihito
- Daiichi Radioisotope Laboratories School of Pharmaceutical Sciences, University of Shizuoka
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- KASHIRAJIMA Takeshi
- The University of the Air
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- MINAMIZAWA Takao
- Daiichi Radioisotope Laboratories
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- SATO Hiroyasu
- School of Pharmaceutical Sciences, Ohu University
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- IWAKI Kazuo
- School of Pharmaceutical Sciences, Ohu University
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- UEDA Taisuke
- Hayashi Pure Chemical Ind., Ltd.
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- KIMURA Yoshio
- Hayashi Pure Chemical Ind., Ltd.
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- TOYO'OKA Toshimasa
- School of Pharmaceutical Sciences, University of Shizuoka
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- MAITANI Tamio
- National Institute of Health Sciences
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- MATSUDA Rieko
- National Institute of Health Sciences
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- HAYASHI Yuzuru
- National Institute of Health Sciences
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The stochastic properties of baseline noise in HPLC systems with a UV photo-diode array, photo-multiplier and γ-ray detector were examined by dividing the noise into auto-correlated random process (Markov process) and an independent process (white noise). The present work focused on the effect of the stochastic noise properties on a theoretical estimation of the standard deviation (SD) of area measurements in instrumental analyses. An estimation theory, called FUMI theory (Function of Mutual Information), was taken as an example. A computer simulation of noise was also used. It was shown that the reliability (confidence intervals) of theoretical SD estimates mainly depends on the following factors: the ratio of the white noise and Markov process occurring in the baselines; the number of data points used for the estimation; the width of a target peak for which the SD is estimated.
収録刊行物
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- Analytical Sciences
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Analytical Sciences 23 (9), 1077-1080, 2007
社団法人 日本分析化学会
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詳細情報 詳細情報について
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- CRID
- 1390282679233064064
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- NII論文ID
- 130004441534
- 10019747049
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- NII書誌ID
- AA10500785
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- ISSN
- 13482246
- 09106340
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- NDL書誌ID
- 8890891
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可