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- Yamamoto Hitoshi
- Technology Center Electronic Materials, Coating Effects Segment, Ciba Specialty Chemicals K.K.
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- Asakura Toshikage
- Technology Center Electronic Materials, Coating Effects Segment, Ciba Specialty Chemicals K.K.
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- Nishimae Yuichi
- Technology Center Electronic Materials, Coating Effects Segment, Ciba Specialty Chemicals K.K.
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- Matsumoto Akira
- Technology Center Electronic Materials, Coating Effects Segment, Ciba Specialty Chemicals K.K.
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- Tanabe Junichi
- Technology Center Electronic Materials, Coating Effects Segment, Ciba Specialty Chemicals K.K.
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- Birbaum Jean-Luc
- Technology Center Electronic Materials, Coating Effects Segment, Ciba Specialty Chemicals K.K.
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- Murer Peter
- Technology Center Electronic Materials, Coating Effects Segment, Ciba Specialty Chemicals K.K.
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- Hinterman Tobias
- Technology Center Electronic Materials, Coating Effects Segment, Ciba Specialty Chemicals K.K.
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- Ohwa Masaki
- Technology Center Electronic Materials, Coating Effects Segment, Ciba Specialty Chemicals K.K.
この論文をさがす
抄録
Oxime sulfonate compounds are one of the important chemistry as photoacid generator for advanced lithography application and practically used in mass production of semiconductor chips. This chemistry is adjustable for various applications like g-/h-/i-line, KrF and ArF lithography. This paper describes an overview of oxime sulfonate chemistry for semiconductor resist application, including commercially available products.
収録刊行物
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- Journal of Photopolymer Science and Technology
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Journal of Photopolymer Science and Technology 20 (5), 637-642, 2007
フォトポリマー学会
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詳細情報 詳細情報について
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- CRID
- 1390282679300563328
-
- NII論文ID
- 130004464597
- 40015602541
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- NII書誌ID
- AA11576862
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- COI
- 1:CAS:528:DC%2BD2sXot1Wmtr4%3D
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- ISSN
- 13496336
- 09149244
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- NDL書誌ID
- 8918824
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可