書誌事項
- タイトル別名
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- High Sensitive Measurement System of Birefringence using Optical Phase Modulator and Two Faraday Rotators.
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説明
In the fundamental research of optical materials, it has been necessary to measure their polarized functions. Especially, a little birefringence in the ultra thin film such as Langmuir-Brodgett film and its dynamic characteristics such as liquid crystal have not had clearly data and many discussions. Therefore, we are developing a high sensitive measurement system of dynamic birefringence using optical phase modulator (Pockels device) and two Faraday rotators (Faraday device). This report describes some basic workings of the new high sensitive measurement system. It was possible to measure a small birefringence (retardation 5×10-3 rad) and fast axis angle of sample.
収録刊行物
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- 素材物性学雑誌
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素材物性学雑誌 4 (2), 22-34, 1991
日本素材物性学会
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詳細情報 詳細情報について
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- CRID
- 1390282679321473792
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- NII論文ID
- 130004003980
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- ISSN
- 18846610
- 09199853
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可