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High Sensitive Measurement System of Birefringence using Optical Phase Modulator and Two Faraday Rotators.
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- SATO Hidekage
- Dpt, of Electrical and Electronics Eng. Musashi Institute of Technology
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- YAMAGUCHI Masaru
- Dpt, of Electrical and Electronics Eng. Musashi Institute of Technology
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- YOSHIMOTO Akira
- Dpt, of Electrical and Electronics Eng. Musashi Institute of Technology
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- TAKADA Tatsuo
- Dpt, of Electrical and Electronics Eng. Musashi Institute of Technology
Bibliographic Information
- Other Title
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- 光位相変調器とファラデー素子を用いた高感度自動複屈折測定装置の開発
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Description
In the fundamental research of optical materials, it has been necessary to measure their polarized functions. Especially, a little birefringence in the ultra thin film such as Langmuir-Brodgett film and its dynamic characteristics such as liquid crystal have not had clearly data and many discussions. Therefore, we are developing a high sensitive measurement system of dynamic birefringence using optical phase modulator (Pockels device) and two Faraday rotators (Faraday device). This report describes some basic workings of the new high sensitive measurement system. It was possible to measure a small birefringence (retardation 5×10-3 rad) and fast axis angle of sample.
Journal
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- Journal of the Society of Materials Engineering for Resources of Japan
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Journal of the Society of Materials Engineering for Resources of Japan 4 (2), 22-34, 1991
The Society of Materials Engineering for Resources of JAPAN
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Details 詳細情報について
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- CRID
- 1390282679321473792
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- NII Article ID
- 130004003980
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- ISSN
- 18846610
- 09199853
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- Text Lang
- ja
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- Data Source
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- JaLC
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed