High Sensitive Measurement System of Birefringence using Optical Phase Modulator and Two Faraday Rotators.

DOI 1 Citations
  • SATO Hidekage
    Dpt, of Electrical and Electronics Eng. Musashi Institute of Technology
  • YAMAGUCHI Masaru
    Dpt, of Electrical and Electronics Eng. Musashi Institute of Technology
  • YOSHIMOTO Akira
    Dpt, of Electrical and Electronics Eng. Musashi Institute of Technology
  • TAKADA Tatsuo
    Dpt, of Electrical and Electronics Eng. Musashi Institute of Technology

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Other Title
  • 光位相変調器とファラデー素子を用いた高感度自動複屈折測定装置の開発

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Description

In the fundamental research of optical materials, it has been necessary to measure their polarized functions. Especially, a little birefringence in the ultra thin film such as Langmuir-Brodgett film and its dynamic characteristics such as liquid crystal have not had clearly data and many discussions. Therefore, we are developing a high sensitive measurement system of dynamic birefringence using optical phase modulator (Pockels device) and two Faraday rotators (Faraday device). This report describes some basic workings of the new high sensitive measurement system. It was possible to measure a small birefringence (retardation 5×10-3 rad) and fast axis angle of sample.

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Details 詳細情報について

  • CRID
    1390282679321473792
  • NII Article ID
    130004003980
  • DOI
    10.5188/jsmerj.4.2_22
  • ISSN
    18846610
    09199853
  • Text Lang
    ja
  • Data Source
    • JaLC
    • Crossref
    • CiNii Articles
  • Abstract License Flag
    Disallowed

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