ファンダメンタルパラメーター法によるセラミックス誘電体の蛍光Ｘ線分析

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書誌事項

タイトル別名
  • XPF analysis of dielectric ceramics using fundamental parameter method.
  • ファンダメンタル パラメーターホウ ニ ヨル セラミックス ユウデンタイ ノ

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抄録

XRF analysis using the fundamental parameter (FP) method was studied on a composite oxide material comprised of barium, zinc and tantalum oxides (BZT). In preparing the glass beads, lithium borate as the flux and potassium bromide as the releasing agent were found most suitable agents. No particular segregation of the elements was observed in the glass beads with the dilution ratio (sample : flux) ranging from 1 : 2 to 1 : 10. By using these glass beads, the calibration curves were derived based on both the calibration and FP methods. A better linearity with less beviations was obtained for FP method. The accuracy of the calibration curves obtained by the calibration method and the FP method were compared by using the glass beads having the dilution ratios of 1:2 and 1 : 10, and it was found that higher accuracy was obtained by FP method for both dilution ratios. Furthermore, the accuracy for the glass bead of dilution ratio of 1 : 2 was found higher than that of 1 : 10 ratio. This proposed method showed good repeatability and reproducibility, and the relative standard deviations for each component were less than 0.05%.

収録刊行物

  • 分析化学

    分析化学 38 (1), T1-T4, 1989

    公益社団法人 日本分析化学会

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