Determination of Trace Elements in Wheat Flour by X-Ray Fluorescence Analysis and Its Application to Identification of Their Production Area

DOI Web Site Web Site 4 Citations 40 References Open Access
  • Otaka Akiko
    Department of Applied Chemistry, Faculty of Science, Tokyo University of Science
  • Yanada Yoko
    Department of Applied Chemistry, Faculty of Science, Tokyo University of Science
  • Hokura Akiko
    Department of Green & Sustainable Chemistry, Faculty of Engineering, Tokyo Denki University
  • Matsuda Kenji
    PANalytical Division, Spectris Corporation
  • Nakai Izumi
    Department of Applied Chemistry, Faculty of Science, Tokyo University of Science

Bibliographic Information

Other Title
  • 蛍光Ｘ線分析法による小麦粉中の微量元素定量と産地判別への応用
  • ケイコウ Xセン ブンセキホウ ニ ヨル コムギコ チュウ ノ ビリョウ ゲンソ テイリョウ ト サンチ ハンベツ エ ノ オウヨウ

Search this article

Description

Trace elements in wheat flour were determined by an X-ray fluorescence (XRF) analysis in order to identify their production area. By optimizing the measurement conditions of an energy-dispersive XRF spectrometer equipped with 3-dimentional polarization optics, the analysis of heavy elements at sub-ppm levels was possible, and linear calibration curves for 17 elements (Na, Mg, Al, P, S, Cl, K, Ca, Mn, Fe, Cu, Zn, Br, Rb, Sr, Mo, Cd) in wheat flour were obtained. We determined the trace elements for 63 wheat flour samples that were produced in Japan or imported from overseas. The analytical results were subjected to multivariate analysis to discriminate the domestic and imported wheat flours. Principal-components analysis successfully distinguished the two origins. The present study has demonstrated that the XRF technique can provide a rapid and easy way for the provenance analysis of wheat flours, which will be further applied to the quality control of commercial food products.

Journal

  • BUNSEKI KAGAKU

    BUNSEKI KAGAKU 58 (12), 1011-1022, 2009

    The Japan Society for Analytical Chemistry

Citations (4)*help

See more

References(40)*help

See more

Keywords

Details 詳細情報について

Report a problem

Back to top