Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing
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- MIYASE Kohei
- Kyushu Institute of Technology
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- NODA Kenji
- STARC
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- ITO Hideaki
- STARC
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- HATAYAMA Kazumi
- STARC
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- AIKYO Takashi
- STARC
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- YAMATO Yuta
- Kyushu Institute of Technology
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- FURUKAWA Hiroshi
- Kyushu Institute of Technology
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- WEN Xiaoqing
- Kyushu Institute of Technology
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- KAJIHARA Seiji
- Kyushu Institute of Technology
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抄録
Test data modification based on test relaxation and X-filling is the preferred approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop reduction. In this paper, we propose a novel test relaxation method, called Distribution-Controlled X-Identification (DC-XID), which controls the distribution of X-bits identified in a set of fully-specified test vectors for the purpose of effectively reducing IR-drop. Experiments on large industrial circuits demonstrate the effectiveness and practicality of the proposed method in reducing IR-drop, without lowering fault coverage, increasing test data volume and circuit size.
収録刊行物
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- IEICE Transactions on Information and Systems
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IEICE Transactions on Information and Systems E94.D (6), 1216-1226, 2011
一般社団法人 電子情報通信学会
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詳細情報 詳細情報について
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- CRID
- 1390282679354636928
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- NII論文ID
- 10029805011
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- NII書誌ID
- AA10826272
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- ISSN
- 17451361
- 09168532
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- HANDLE
- 10228/00007532
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- IRDB
- Crossref
- CiNii Articles
- KAKEN
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- 抄録ライセンスフラグ
- 使用不可