Comparison of Calculation Techniques for Q-Factor Determination of Resonant Structures Based on Influence of VNA Measurement Uncertainty

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  • KATO Yuto
    National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology
  • HORIBE Masahiro
    National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology

Description

Four calculation techniques for the Q-factor determination of resonant structures are compared on the basis of the influence of the VNA measurement uncertainty. The influence is evaluated using Monte Carlo calculations. On the basis of the deviation, the dispersion, and the effect of nearby resonances, the circle fitting method is the most appropriate technique. Although the 3dB method is the most popular technique, the Q-factors calculated by this method exhibit deviations, and the sign and amount of the deviation depend on the measurement setup. Comparisons using measurement data demonstrate that the uncertainty of the dielectric loss tangent calculated by the circle fitting method is less than a third of those calculated by the other three techniques.

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