Scattered Reflections on Scattering Parameters — Demystifying Complex-Referenced S Parameters —
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- AMAKAWA Shuhei
- Graduate School of Advanced Sciences of Matter, Hiroshima University
抄録
<p>The most commonly used scattering parameters (S parameters) are normalized to a real reference resistance, typically 50Ω. In some cases, the use of S parameters normalized to some complex reference impedance is essential or convenient. But there are different definitions of complex-referenced S parameters that are incompatible with each other and serve different purposes. To make matters worse, different simulators implement different ones and which ones are implemented is rarely properly documented. What are possible scenarios in which using the right one matters? This tutorial-style paper is meant as an informal and not overly technical exposition of some such confusing aspects of S parameters, for those who have a basic familiarity with the ordinary, real-referenced S parameters.</p>
収録刊行物
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- IEICE Transactions on Electronics
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IEICE Transactions on Electronics E99.C (10), 1100-1112, 2016
一般社団法人 電子情報通信学会
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詳細情報 詳細情報について
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- CRID
- 1390282679356635648
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- NII論文ID
- 130005598136
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- ISSN
- 17451353
- 09168524
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
- KAKEN
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- 抄録ライセンスフラグ
- 使用不可