書誌事項
- タイトル別名
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- High-Sensitive X-Ray Imaging Microscopes with Transmission Gratings
- カイセツ ゴウシ オ リヨウ シタ コウカンド Xセン ケツゾウ ケンビキョウ
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抄録
X-ray microscopy is one of promising candidates to non-destructively visualize internal structures in samples under extreme environments. We have developed a high-sensitive X-ray imaging microscope consisting of an objective lens and a transmission grating. The microscope is based on the Talbot effect of the grating and works simply by appending the grating to an X-ray imaging microscope. Our approach has several advantages over the Zernike X-ray phase-contrast microscopy that has been widely used, and can provide a powerful way of quantitative visualization with a high spatial resolution and a high sensitivity even for relatively thick samples.<br>
収録刊行物
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- 高圧力の科学と技術
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高圧力の科学と技術 23 (3), 227-236, 2013
日本高圧力学会
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詳細情報 詳細情報について
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- CRID
- 1390282679358717824
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- NII論文ID
- 10031201661
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- NII書誌ID
- AN10452913
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- COI
- 1:CAS:528:DC%2BC3sXhvVaksLzO
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- ISSN
- 13481940
- 0917639X
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- NDL書誌ID
- 024922249
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- KAKEN
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- 抄録ライセンスフラグ
- 使用不可